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端子1769-IF8
.功能與參數(shù)測(cè)試
1.<測(cè)試儀>對(duì)器件的檢測(cè),僅能反應(yīng)出截止區(qū),放大區(qū)和飽和區(qū).但不
能測(cè)出工作頻率的高低和速度的快慢等具體數(shù)值等.
2.同理對(duì)TTL數(shù)字芯片而言,也只能知道有高低電平的輸出變化.而無(wú)
法查出它的上升與下降沿的速度.
四.晶體振蕩器
1.通常只能用示波器(晶振需加電)或頻率計(jì)測(cè)試,萬(wàn)用表等無(wú)法測(cè)量,
否則只能采用代換法了.
2.晶振常見(jiàn)故障有:a.內(nèi)部漏電,b.內(nèi)部開(kāi)路c.變質(zhì)頻偏d.外圍相連電
容漏電.這里漏電現(xiàn)象,用<測(cè)試儀>的VI曲線(xiàn)應(yīng)能測(cè)出.
3.整板測(cè)試時(shí)可采用兩種判斷方法:a.測(cè)試時(shí)晶振附近既周?chē)挠嘘P(guān)
芯片不通過(guò).b.除晶振外沒(méi)找到其它故障點(diǎn).
4.晶振常見(jiàn)有2種:a.兩腳.b.四腳,其中第2腳是加電源的,注意不可隨
意短路.
五.故障現(xiàn)象的分布
1.電路板故障部位的不完全統(tǒng)計(jì):1)芯片損壞30%, 2)分立元件損壞30%,
3)連線(xiàn)(PCB板敷銅線(xiàn))斷裂30%, 4)程序破壞或丟失10%(有上升趨勢(shì)).
2.由上可知,當(dāng)待修電路板出現(xiàn)聯(lián)線(xiàn)和程序有問(wèn)題時(shí),又沒(méi)有好板子,既
不熟悉它的連線(xiàn),找不到原程序.此板修好的可能性就不大了.
端子1769-IF8
| 1768-CNB |
| 1768-CNBR |
| 1768-ENBT |
| 1768-EWEB |
| 1768-L43 |
| 1768-L43S |
| 1768-L45 |
| 1768-L45S |
| 1768-M04SE |
| 1768-PA3 |
| 1768-PB3 |
| 1769-ASCII |
| 1769-BA |
| 1769-ECL |
| 1769-ECR |
| 1769-HSC |
| 1769-IA16 |
| 1769-IF16C |
| 1769-IF16V |
| 1769-IF4 |
| 1769-IF4I |
| 1769-IF4XOF2 |
| 1769-IF8 |
| 1769-IG16 |
| 1769-IM12 |
| 1769-IQ16 |
| 1769-IQ32 |
| 1769-IQ32T |
| 1769-IQ6XOW4 |
| 1769-IR6 |
| 1769-IT6 |
| 1769-L16ER-BB1B |
| 1769-L18ER-BB1B |
| 1769-L18ERM-BB1B |
| 1769-L19ER-BB1B |
| 1769-L24ER-QB1B |
| 1769-L24ER-QBFC1B |
| 1769-L27ERM-QBFC1B |
| 1769-L30ER |
| 1769-L30ERM |
| 1769-L32E |
| 1769-L33ER |
| 1769-L33ERM |
| 1769-L35E |
| 1769-L36ERM |
| 1769-L37ERM |
| 1769-L38ERM |
| 1769-OA16 |
| 1769-OA8 |
| 1769-OB16 |
| 1769-OB16P |
| 1769-OB32 |
| 1769-OB32T |
| 1769-OB8 |
| 1769-OF2 |
| 1769-OF4 |
| 1769-OF4CI |
| 1769-OF4VI |
| 1769-OF8C |
| 1769-OF8V |
| 1769-OG16 |
| 1769-OV16 |
| 1769-OV32T |
| 1769-OW16 |
| 1769-OW8 |
| 1769-OW8I |
| 1769-PA2 |
| 1769-PA4 |
| 1769-PB2 |
| 1769-PB4 |
| 1769-SDN |
| 1769-SM1 |
| 1769-SM2 |
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| ERN120-1024, 377101-83 |
| ERN120-1024 589611-89 |
| EQN1325.020-2048, ID: 538234-01 |
