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730德國(guó)EPK涂層測(cè)厚儀MINITEST730
MINITEST 700優(yōu)點(diǎn)一覽：
-SIDSP使測(cè)量不受干擾，測(cè)值更加精確
-可更換探頭使用更加靈活（MINITEST 740探頭可由內(nèi)置換為外置）
-FN探頭自動(dòng)識(shí)別基體，使測(cè)量更迅速，避免操作錯(cuò)誤
-溫度補(bǔ)償功能避免溫度變化引起的錯(cuò)誤
-生產(chǎn)過程中50點(diǎn)校準(zhǔn)使儀器獲得高精確度的特征曲線
-大存儲(chǔ)量，能存儲(chǔ)10或100組多達(dá)100,000個(gè)讀數(shù)
-讀數(shù)和統(tǒng)計(jì)值能單獨(dú)調(diào)出
-超大，背光顯示屏，顯示內(nèi)容可180度旋轉(zhuǎn)
-菜單指引操作，25種語言可選
-帶IrDA接口，紅外線傳輸數(shù)據(jù)到打印機(jī)和PC
-可下載更新軟件
標(biāo)準(zhǔn)配置：
帶塑料手提箱，內(nèi)含：
-MINITEST 720(內(nèi)置探頭)
--或MINITEST 730（外置探頭）
--或MINITEST740主機(jī)（不含探頭，有各種探頭可選）
-校準(zhǔn)套裝含校準(zhǔn)片和零板
-操作使用說明CD，德語、英語、法語、西班牙語
-2節(jié)AA電池
推薦配件:
F1.5/N0.7/FN1.5探頭用測(cè)量支架
技術(shù)數(shù)據(jù)表
SIDSP探頭
|
探頭特性 |
F1.5，N0.7，FN1.5 |
F2 |
F5，N2.5，FN5 |
F15 |
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F |
N |
F |
F |
N |
F |
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測(cè)量范圍 |
0-1.5mm |
0-0.7mm |
0-2mm |
0-5mm |
0-2.5mm |
0-15mm |
|
使用范圍 |
小工件，薄涂層，跟測(cè)量支架一起使用 |
粗糙表面 |
標(biāo)準(zhǔn)探頭，使用廣泛 |
厚涂層 |
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測(cè)量原理 |
磁感應(yīng) |
電渦流 |
磁感應(yīng) |
磁感應(yīng) |
電渦流 |
磁感應(yīng) |
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信號(hào)處理 |
探頭內(nèi)部32位信號(hào)處理（SIDSP） |
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精確度 |
±（1μm+0.75%讀值） |
±（1.5μm+0.75%讀值） |
±（5μm+0.75%讀值） |
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重復(fù)性 |
±（0.5μm+0.5%讀值） |
±（0.8μm+0.5%讀值） |
±（2.5μm+0.5%讀值） |
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低端分辨率 |
0.05μm |
0.1μm |
1μm |
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最小曲率半徑（凸） |
1.0mm |
1.5mm |
5mm |
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最小曲率半徑（凹，外置探頭） |
7.5mm |
10mm |
25mm |
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最小曲率半徑（凹，內(nèi)置探頭） |
30mm |
30mm |
30mm |
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最小測(cè)量面積 |
Φ5mm |
Φ10mm |
Φ25mm |
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最小基體厚度 |
0.3mm |
40μm |
0.5mm |
0.5mm |
40μm |
1mm |
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連續(xù)模式下測(cè)量速度 |
每秒20個(gè)讀數(shù) |
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單值模式下最大測(cè)量速度 |
每分鐘70個(gè)讀數(shù) |
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主機(jī)
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|
MINITEST 720 |
MINITEST 730 |
MINITEST 740 |
|
探頭類型 |
內(nèi)置 |
外置 |
內(nèi)置外置可換 |
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數(shù)據(jù)記憶組數(shù) |
10 |
10 |
100 |
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存儲(chǔ)數(shù)據(jù)量 |
最多10,000個(gè) |
最多10,000個(gè) |
最多100,000個(gè) |
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統(tǒng)計(jì)值 |
讀值個(gè)數(shù)，最小值，最大值，平均值，標(biāo)準(zhǔn)方差，變異系數(shù)，組統(tǒng)計(jì)值（標(biāo)準(zhǔn)設(shè)置/自由配置） |
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校準(zhǔn)程序符合國(guó)際標(biāo)準(zhǔn)和規(guī)范 |
ISO，SSPC，瑞典標(biāo)準(zhǔn)，澳大利亞標(biāo)準(zhǔn) |
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校準(zhǔn)模式 |
出廠設(shè)置校準(zhǔn)，零點(diǎn)校準(zhǔn)，2點(diǎn)校準(zhǔn)，3點(diǎn)校準(zhǔn)，使用者可調(diào)節(jié)補(bǔ)償值 |
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極限值監(jiān)控 |
聲、光報(bào)警提示超過極限 |
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測(cè)量單位 |
um，mm，cm；mils，inch，thou |
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操作溫度 |
-10℃-60℃ |
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存放溫度 |
-20℃-70℃ |
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數(shù)據(jù)接口 |
IrDA 1.0（紅外接口） |
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電源 |
2節(jié)AA電池 |
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標(biāo)準(zhǔn) |
DIN EN ISO 1461，2064，2178，2360，2808，3882，19840 |
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體積 |
157mm x 75.5mm x 49mm |
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重量 |
約175g |
約210g |
約175g（內(nèi)置）/230g（外置 |
730 Germany EPK coating thickness testerMINITEST730
The advantages of MINITEST 700:
-SIDSP enables the measurement without interference,measurement more accurate
- replaceable probe is more flexible in use (MINITEST 740 probe can be built for external)
Automatic recognition of -FN probe substrate, makes the measurement more quickly, avoid operating errors
Temperature compensation function to avoid the errorcaused by the change of temperature
Production process in 50 point - the instrument gainscharacteristic curve with high accuracy
- large memory capacity, can store 10 or 100 groups ofup to 100000 readings
- reading and statistical values can separate out
- large, backlit display, display content can be rotated 180 degrees
- menu guide, 25 languages
With IrDA interface, infrared transmission data to the printer and PC
- can download the update software
Standard configuration:
With plastic suitcase, intron:
-MINITEST 720 (the built-in probe)
730 - or MINITEST (external probe)
-- or MINITEST740 host (not including the probe, a variety of probe is optional)
- Calibration Kit with calibration and zero plate
Operating instructions CD, German, English, French,Spanish
-2 AA battery
Recommended accessories:
Measurement of stent with F1.5/N0.7/FN1.5 probe
Technical data sheet
SIDSP probe
Characteristics of the probe
F1.5, N0.7, FN1.5
F2
F5, N2.5, FN5
F15
F
N
F
F
N
F
Measuring range
0-1.5mm
0-0.7mm
0-2mm
0-5mm
0-2.5mm
0-15mm
Range of use
Small workpiece, thin coating, with a measuring bracket
Rough surface
Probe, widely used
Thick coating
The measuring principle
Magnetic induction
Eddy current
Magnetic induction
Magnetic induction
Eddy current
Magnetic induction
Signal processing
Probe the internal 32 bit signal processing (SIDSP)
Accuracy
± (1 μ m+0.75% reading)
± (1.5 μ m+0.75% reading)
± (5 μ m+0.75% reading)
Repeatability
± (0.5 μ m+0.5% reading)
± (0.8 μ m+0.5% reading)
± (2.5 μ m+0.5% reading)
Low resolution
0.05 μ
0.1 μ
1 μ
The minimum radius of curvature (convex)
1.0mm
1.5mm
5mm
The minimum radius of curvature (sag, external probe)
7.5mm
10mm
25mm
The minimum radius of curvature (sag, the built-in probe)
30mm
30mm
30mm
The minimum area measurement
Phi 5mm
Phi 10mm
Phi 25mm
The minimum thickness of the matrix
0.3mm
40 μ
0.5mm
0.5mm
40 μ
1mm
Continuous mode measurement speed
The 20 readings per second
Single mode maximum measurement speed
70 readings per minute
Host
Model
Characteristic
MINITEST 720
MINITEST 730
MINITEST 740
Probe type
Built-in
External
The built-in external exchange
Data memory group number
10
10
100
The data storage capacity
Up to 10000
Up to 10000
Up to 100000
Statistical values
Read the number, minimum, maximum, mean, standard deviation, coefficient of variation, group statistics(standard setting / free configuration)
Calibration procedures in line with international standards and specifications
ISO, SSPC, Sweden, Australia standard
Calibration mode
Factory set calibration, zero calibration, calibration of 2points, 3 point calibration, the user can adjust thecompensation value
Limit monitoring
Acoustic, optical alarm over the limit
The unit of measurement
Um, mm, cm; mils, inch, thou
Operating temperature
-10 ℃ -60 ℃
Storage temperature
-20 ℃ -70 ℃
Data interface
IrDA 1 (infrared interface)
Power Supply
2 AA batteries
Standard
DIN EN ISO 14612064217823602808388219840
ASTM B244, B499, D7091, E376
AS 3894.3, SS 184160, SSPC-PA 2
Volume
157mm x 75.5mm x 49mm
Weight
About 175g
About 210g
About 175g (built-in) /230g (external
